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Metrologia is an international journal dealing with the scientific aspects of metrology.
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Goebel R.,
Kim W.-S., Fletcher N., Stock M.,
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the KRISS (Rep. of Korea) and the BIPM,
Metrologia,
2012,
49, Tech. Suppl.,
01006
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Goebel R.,
Power O., Fletcher N., Stock M.,
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NSAI-NML (Ireland) and the BIPM,
Metrologia,
2012,
49, Tech. Suppl.,
01004
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Goebel R.,
Power O., Fletcher N., Stock M.,
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NSAI-NML (Ireland) and the BIPM,
Metrologia,
2012,
49, Tech. Suppl.,
01005
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Solve S.,
Chayramy R., Stock M., Streit J., Šíra M.,
Comparison of the Josephson voltage standards of the CMI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Metrologia,
2012,
49, Tech. Suppl.,
01003
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de Mirandés E.,
Fang H., Kiss A., Solve S., Stock M., Picard A.,
Alignment procedure used in the BIPM watt balance,
Proc. 2010 Conference on Precision Electromagnetic Measurements (CPEM),
2011,
522-523
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Goebel R.,
Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M.,
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the GUM (Poland) and the BIPM,
Metrologia,
2011,
48, Tech. Suppl.,
01001
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Goebel R.,
Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M.,
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the GUM (Poland) and the BIPM,
Metrologia,
2011,
48, Tech. Suppl.,
01002
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Janssen T.J.B.M.,
Fletcher N.E., Goebel R., Williams J.M., Tzalenchuk A., Yakimova R., Kubatkin S., Lara-Avila S., Falko V.I.,
Graphene, universality of the quantum Hall effect and redefinition of the SI system,
New J. Phys.,
2011,
13,
093026
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Picard A.,
Bradley M.P., Fang H., Kiss A., de Mirandés E., Parker B., Solve S., Stock M.,
The BIPM watt balance: Improvements and developments,
Proc. 2010 Conference on Precision Electromagnetic Measurements (CPEM),
2011,
66-67
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Power O.,
Solve S., Chayramy R., Stock M.,
Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2011 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Metrologia,
2011,
48, Tech. Suppl.,
01010
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Solve S.,
Chayramy R.,
The BIPM compact Josephson voltage standard,
Proc. 2010 Conference on Precision Electromagnetic Measurements (CPEM),
2011,
155-156
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Solve S.,
Chayramy R.,
The BIPM compact Josephson voltage standard,
IEEE Trans. Instrum. Meas.,
2011,
60(7),
2366-2371
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Solve S.,
Chayramy R., Stock M.,
The BIPM 1.018 V Zener Measurement Set-up,
Rapport BIPM-2011/05,
32 pp
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Solve S.,
Chayramy R., Stock M., Katkov A.,
Comparison of the Josephson voltage standards of the VNIIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Metrologia,
2011,
48, Tech. Suppl.,
01007
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Solve S.,
Chayramy R., Stock M., Zhou Y., Lee J., Wey Chua S.,
Comparison of the Josephson voltage standards of the NMC, A*STAR and the BIPM (part of the ongoing BIPM key comparisons BIPM.EM-K10.a and BIPM.EM-K10.b),
Metrologia,
2011,
48, Tech. Suppl.,
01006
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Tang Y.,
Solve S., Witt T.J.,
Impact of 1/f noise of DVM on Josephson voltage standard comparison,
Proc. 2010 Conference on Precision Electromagnetic Measurements (CPEM),
2011,
175-176
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Tang Y.,
Solve S., Witt T.J.,
Allan variance analysis of Josephson voltage standard comparison for data taken at unequal time intervals,
IEEE Trans. Instrum. Meas.,
2011,
60(7),
2248-2254
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Fletcher N.,
Goebel R., Wang Y.,
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NIST, United States and the BIPM, June 2007-March 2008,
Metrologia,
2010,
47, Tech. Suppl.,
01013
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Goebel R.,
Kurupakorn C., Fletcher N., Stock M.,
Final report on bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NIMT-Thailand and the BIPM,
Metrologia,
2010,
47, Tech. Suppl.,
01005
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Power O.,
Solve S., Chayramy R., Stock M.,
Bilateral comparison of 1.018 V and 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2010 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b),
Metrologia,
2010,
47, Tech. Suppl.,
01017
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Solve S.,
Chayramy R., Stock M., Holiastou M., Flouda I.,
Comparison of the Josephson voltage standards of the EIM and the BIPM,
Metrologia,
2010,
47, Tech. Suppl.,
01009
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Solve S.,
Chayramy R., Stock M., Nicolas J., Van Theemsche A.,
Comparison of the Josephson voltage standards of the SMD and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Metrologia,
2010,
47, Tech. Suppl.,
01004
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Streit J.,
Fletcher N.,
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the CMI, Czech Republic and the BIPM, January-July 2009,
Metrologia,
2010,
47, Tech. Suppl.,
01012
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Streit J.,
Fletcher N.,
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the CMI, Czech Republic and the BIPM, January-July 2009,
Metrologia,
2010,
47, Tech. Suppl.,
01014
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Tonina A.,
Iuzzolino R., Bierzychudek M., Real M., Solve S., Chayramy R., Stock M.,
Bilateral comparison of 1.018 V and 10 V standards between the INTI (Argentina) and the BIPM, August to October 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b),
Metrologia,
2010,
47, Tech. Suppl.,
01002
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Witt T.J.,
Fletcher N.E.,
Standard deviation of the mean and other time series properties of voltages measured with a digital lock-in amplifier,
Metrologia,
2010,
47(5),
616-630
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Goebel R.,
Fletcher N., Stock M., Pritchard B., Xie R., Coogan P., Johnson L.,
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NMIA (Australia) and the BIPM,
Metrologia,
2009,
46, Tech. Suppl.,
01011
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Goebel R.,
Power O., Fletcher N., Stock M.,
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML-Ireland and the BIPM,
Metrologia,
2009,
46, Tech. Suppl.,
01012
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Goebel R.,
Power O., Fletcher N., Stock M.,
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML-Ireland and the BIPM,
Metrologia,
2009,
46, Tech. Suppl.,
01013
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Picard A.,
Fang H., Kiss A., de Mirandés E., Stock M., Urano C.,
Progress on the BIPM watt balance,
IEEE Trans. Instrum. Meas.,
2009,
58(4),
924-929
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Power O.,
Solve S., Chayramy R.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, April to May 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Metrologia,
2009,
46, Tech. Suppl.,
01008
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Solve S.,
Chayramy R., Djorjevic S., Séron O.,
Comparison of the Josephson voltage standards of the LNE and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Metrologia,
2009,
46, Tech. Suppl.,
01002
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Solve S.,
Chayramy R., Stock M., Tang Y.H., Sims J.E.,
Comparison of the Josephson Voltage Standards of the NIST and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Metrologia,
2009,
46, Tech. Suppl.,
01010
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Wood B.M.,
Solve S.,
A review of Josephson comparison results,
Metrologia,
2009,
46(6),
R13-R20
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Djordjevic S.,
Séron O., Solve S., Chayramy R.,
Direct comparison between a programmable and a conventional Josephson voltage standard at the level of 10 V,
Metrologia,
2008,
45(4),
429-435
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Goebel R.,
Chrobok P., Fletcher N., Stock M.,
Final report on the bilateral comparison of 1  standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the CMI (Czech Republic) and the BIPM,
Metrologia,
2008,
45, Tech. Suppl.,
01004
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Goebel R.,
Chrobok P., Fletcher N., Stock M.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the CMI (Czech Republic) and the BIPM,
Metrologia,
2008,
45, Tech. Suppl.,
01010
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GoebeL R.,
Elmquist R., Fletcher N., Stock M.,
Final report on the bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NIST (USA) and the BIPM,
Metrologia,
2008,
45, Tech. Suppl.,
01001
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Power O.,
Fletcher N.,
Final report on the bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NML, Ireland and the BIPM, June-October 2007,
Metrologia,
2008,
45, Tech. Suppl.,
01002
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Power O.,
Murray J., Solve S., Chayramy R.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, May to June 2008 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Metrologia,
2008,
45, Tech. Suppl.,
01008
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Solve S.,
Chayramy R., Stock M., Kim K.-T., Song W., Kim M.-S., Chong Y.,
Comparison of the Josephson voltage standards of the KRISS and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Metrologia,
2008,
45, Tech. Suppl.,
01006
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Solve S.,
Chayramy R., Stock M., Kim K.-T., Song W., Kim M.-S., Chong Y.,
Bilateral comparison of 1.018 V and 10 V standards between the KRISS (Republic of Korea) and the BIPM, February 2008 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b),
Metrologia,
2008,
45, Tech. Suppl.,
01007
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A. S. Katkov,
S. Solve, M. Stock,
Bilateral comparison of 10 V standards between the VNIIM (Russia) and the BIPM, August to October 2007 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2007/07,
10 pp
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Fischer J.,
Stock M. et al.,
Preparative steps towards the new definition of the kelvin in terms of the Boltzmann constant,
Int. J. Thermophysics,
2007,
28(6),
1753-1765
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Fletcher N.E.,
Giblin S.P., Williams J.M., Lines K.L.,
New capability for generating and measuring small dc currents at NPL,
IEEE Trans. Instrum. Meas.,
2007,
56,
326-330
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Litorja M.,
Fowler J., Hartmann J., Fox N., Stock M., Razet A., Khlevnoy B., Ikonen E., Machacs M., Doytchinov K.,
Final report on the CCPR-S2 supplementary comparison of area measurements of apertures for radiometry,
Metrologia,
2007,
44, Tech. Suppl.,
02002
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Picard A.,
Fang H., Stock M.,
The BIPM watt balance: Progress and principle,
Proc. 20th IMEKO TC3 Conference,
2007,
12 pp
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Picard A.,
Stock M., Fang H., Witt T.J., Reymann D.,
The BIPM watt balance,
IEEE Trans. Instrum. Meas.,
2007,
56,
538-542
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Power O.,
Solve S., Stock M., Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, March to April 2007 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2007/03,
7 pp
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Reymann D.,
Solve S.,
Limits to the accuracy of 10 V Josephson standards revealed by BIPM on-site comparisons,
IEEE Trans. Instrum. Meas.,
2007,
56,
555-558
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Solve S.,
Chayramy R., Reymann D.,
A new fully automated measurement chain for electronic voltage standards at 1.018 V,
IEEE Trans. Instrum. Meas.,
2007,
56,
588-591
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Solve S.,
Chayramy R., van den Brom H.E., Houtzager E.,
Comparison of the Josephson voltage standards of NMi-VSL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2007/01,
12 pp
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Stock M.,
Watt balance experiments: towards an improved SI system,
Proc. VII Semetro, Belo Horizonte,
2007,
4 pp
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Witt T.J.,
Using the autocorrelation function to characterize time series of voltage measurements,
Metrologia,
2007,
44(3),
201-209
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Georgieva U.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the NCM (Bulgaria) and the BIPM, April to June 2006 (part of the ongoing BIPM key comparisons BIPM.EM-K11.a and .b),
Rapport BIPM-2006/05,
7 pp
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Klushin A.M.,
Solve S. et al.,
A new millimeterwave synthesizer for Josephson voltage standards,
CPEM 2006 Digest,
2006,
368-369
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Popovici G.,
Cirneanu L., Simionescu M., Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the INM (Romania) and the BIPM, May 2006,
Rapport BIPM-2006/11,
6 pp
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Popovici G.,
Cirneanu L., Simionescu M., Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the INM (Romania) and the BIPM, April 2006,
Rapport BIPM-2006/12,
7 pp
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Power O.,
Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML (Ireland) and the BIPM, April 2006,
Rapport BIPM-2006/13,
6 pp
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Power O.,
Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML (Ireland) and the BIPM, April 2006,
Rapport BIPM-2006/14,
6 pp
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Power O.,
Reymann D., Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, April to June 2006 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2006/04,
6 pp
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Reymann D.,
Solve S., Afonso E., Ferreira V., Landim R.P.,
Comparison of the Josephson voltage standards of the INMETRO and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2006/06,
14 pp
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Reymann D.,
Solve S., Budovsky I., Rigby R.,
Comparison of the Josephson voltage standards of the NMIA and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2006/09,
12 pp
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Reymann R.,
Solve S., Nunes M.C., Ribeiro L.F.,
Comparison of the Josephson voltage standards of the INETI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2006/03,
11 pp
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Stock M.,
Watt balances and the future of the kilogram,
Proc. Symposium of Metrology 2006, Quéretaro, Mexico,
2006,
6 pp
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Stock M.,
Solve S.,
International comparison of water triple point cells leading to a more precise definition of the kelvin,
Proc. Symposium of Metrology 2006, Quéretaro, Mexico,
2006,
6 pp
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Stock M.,
Solve S., del Campo D., Chimenti V., Méndez-Lango E., Liedber H., Steur P.P.M., Marcarino P., Dematteis R., Filipe E., Lobo I., Kang K.H., Gam K.S., Kim Y.-G., Renaot E., Bonnier G., Valin M., White R., Dransfield T.D., Duan Y., Xiaoke Y., Strouse G., Ballico M., Sukkar D., Arai M., Mans A., de Groot M., Kerkhof O., Rusby R., Gray J., Head D., Hill K., Tegeler E., Noatsch U., Duris S., Kho H.Y., Ugur S., Pokhodun A., Gerasimov S.F.,
Final Report on CCT-K7: Key comparison of water triple point cells,
Metrologia,
2006,
43, Tech. Suppl.,
03001
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Stock M.,
Witt T.J.,
International news - CPEM 2006 Round table discussion 'Proposed changes to the SI',
Metrologia,
2006,
43(6),
583-592
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Urano C,,
Reymann D., Solve S. et al.,
Comparison of two 10 V Josephson arrays of the NMIJ-AIST,
CPEM 2006 Digest,
2006,
392-393
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Delahaye F.,
Goebel R.,
Evaluation of the frequency dependence of the resistance and capacitance standards in the BIPM quadrature bridge,
IEEE Trans. Instrum. Meas.,
2005,
54(2),
533-537
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Reymann D.,
Power O, Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, March to April 2005 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2005/04,
6 pp
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Reymann D.,
Solve S., Hernandez R., Perez S., Raso F.,
Comparison of the Josephson voltage standards of the CEM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/12,
7 pp
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Reymann D.,
Solve S., Porter C.H., Jansen T.J.B.M., Williams J.M.,
Comparison of the Josephson voltage standards of the NPL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/02,
10 pp
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Reymann D.,
Solve S., Urano C., Marayama Y., Yoshida H.,
Comparison of the Josephson voltage standards of the NMIJ-AIST and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/13,
9 pp
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Reymann D.,
Solve S., Waldmann W., Heine G., Scheibenreiter P., Pribil J.,
Comparison of the Josephson voltage standards of the BEV and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/14,
7 pp
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Reymann D.,
Solve S., Wood B.,
Comparison of the Josephson voltage standards of the NRC and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/03,
14 pp
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Witt T.J.,
Allan variances and spectral densities for DC voltage measurements with polarity reversals,
IEEE Trans. Instrum. Meas.,
2005,
54(2),
550-553
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Witt T.J.,
Tang Y.,
Investigations of noise in measurements of electronic voltage standards,
IEEE Trans. Instrum. Meas.,
2005,
54(2),
567-570
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Delahaye F.,
Holiastou M., Flouda E., Jaouen A., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the EIM, Greece and the BIPM, September 2003,
Rapport BIPM-2004/07,
8 pp
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Delahaye F.,
Power O., Jaouen A., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML (Ireland) and the BIPM, June 2004,
Rapport BIPM-2004/14,
6 pp
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Delahaye F.,
Power O., Jaouen A., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML (Ireland) and the BIPM, June 2004,
Rapport BIPM-2004/13,
5 pp
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Power O.,
Delahaye F.,
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b between the NML, Ireland and the BIPM, January/April 2004,
Rapport BIPM-2004/10,
7 pp
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Reymann D.,
Frenkel R., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the NML/CSIRO (Australia) and the BIPM, October to December 2003 (part of the ongoing BIPM key comparisons BIPM.EM-K11a & b),
Rapport BIPM-2004/03,
8 pp
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Reymann D.,
Power O., Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, March to May 2004 (part of the ongoing BIPM key comparison BIPM.EM-K11b),
Rapport BIPM-2004/09,
12 pp
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Reymann D.,
Tarnow E., Witt T.J.,
Bilateral comparison of 10 V standards between the CSIR-NML (South Africa) and the BIPM, October to December 2003 (part of the ongoing BIPM key comparison BIPM.EM-K11b),
Rapport BIPM-2004/02,
13 pp
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Yu K.M.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the KRISS, Republic of Korea and the BIPM, June 2003,
Rapport BIPM-2004/01,
7 pp
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Behr R.,
Kohlmann J., Janssen T.J.B.M., Kleinschmidt P., Williams J.M., Djordjevic S., Lo-Hive J.-P., Piquemal F., Hetland P.O., Reymann D., Eklund G., Hof Ch., Jeanneret B., Chevtchenko O., Houtzager E., Brom H. van den Sosso A., Andreone D., Nissilä J., Helisto P.,
Analysis of different measurement setups for a programmable Josephson voltage standard,
IEEE Trans. Instrum. Meas,
2003,
52,
524-528
|
|
|
| |
Delahaye F.,
Awan S.A.,
Bilateral comparison of 10 pF and 100 pF capacitance standards (ongoing BIPM key comparisons BIPM.EM-K14.a and BIPM.EM-K14.b) between the NPL and the BIPM, April/May 2002 (report modified July 2004),
Rapport BIPM-2003/01,
10 pp
|
|
|
| |
Delahaye F.,
Jeckelmann B.,
Revised technical guidelines for reliable dc measurements of the quantized Hall resistance,
Metrologia,
2003,
40(5),
217-223
|
|
|
| |
Kupec J.,
Ahlers H., Belliss J., Bryant S., Fiorillo F., Khorev V., Kohout V., Shifrin V., Weyand K.,
EUROMET EM.M-S1 - EUROMET Project No. 597: Comparison of magnetic flux by means of a coil transfer standard,
Metrologia,
2003,
40, Tech. Suppl.,
01006
|
|
|
| |
Liefrink F.,
Dierikx E.F., Heimeriks J.W., Eklund G., Flouda I., Funck T., Helistö P., Jakab A., Janssen J.-T., Jeanneret B., Jensen H.D., Hetland P.O., Lindic M., Lo-Hive J.-P., Nicolas J., Nunes M., Power O., Raso Alonso F.I., Reymann D., Selçik S., Streit J., Vrab,
EUROMET project no 429: Comparison of 10 V electronic voltage standards,
Metrologia,
2003,
40, Tech. Suppl.,
01004
|
|
|
| |
Power O.,
Reymann D., Witt T.J.,
Bilateral comparison of 10 V standards (part of the ongoing BIPM key comparison BIPM.EM-K11.b) between the NML (Ireland) and the BIPM, March 2003,
Rapport BIPM-2003/06,
6 pp
|
|
|
| |
Reymann D.,
Link between the comparison EUROMET.EM.BIPM-K11.b and the ongoing comparison BIPM.EM-K11.b,
Metrologia,
2003,
40, Tech. Suppl.,
01005
|
|
|
| |
Witt T.J.,
Experimental sampling distributions and confidence intervals of the Allan variance in some DC electrical measurements,
IEEE Trans. Instrum. Meas,
2003,
52,
487-490
|
|
|
|
|
|
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